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Equipment for characterization

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Equipment for surface characterization, microscopy and concentration determination:

Transmission electron microscope (TEM) with scanning mode (STEM) and energy dispersive spectrometer (EDX);

X-ray photoelectron spectrometer (XPS);

Scanning probe microscopy (SPM) equipment (includes AFM, STM and micro-Raman);

Microwave plasma atomic emission spectrometer (MP-AES);

Porosimeter (BET).

Optical spectroscopy equipment:

Spectrofluorometer (steady state and time resolved photoluminescence spectrometer);

Spectroscopic ellipsometer;

Fourier transform infrared spectrometer (FT-IR);

Raman spectrometer (included in the SPM platform).

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